GRK 1896 "In Situ Microscopy with Electrons, X-rays and Scanning Probes"
9. Oct. 2017
International Congress Engineering of Advanced Materials
10. - 12. Oct. 2017
Inauguration of the new X-ray Microscope Xradia 810 Ultra
10. Nov. 2017
Welcome to the Center for Nanoanalysis and Electron Microscopy
The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy. With the combination of these methods new materials, particles, structures and devices are characterized not only microscopically and analytically on all length scales even down to the atomic scale but also by various in situ investigations and 3D methods. The knowledge gained through the versatile characterization methods is then used to further develop and improve materials and devices.
CENEM was established in 2010 to provide a forefront research center for the versatile characterization of materials
and devices with state-of-the-art instrumentation and expertise and to intensify the interdisciplinary research.
The big CENEM network represents the strong collaborations within the University of Erlangen-Nürnberg as well as
the collaboration with other universities, dedicated research institutes and industry.
The support of the core facility CENEM by the German Science Foundation (DFG) and the Cluster of Excellence EXC 315 “Engineering of Advanced Materials” is gratefully acknowledged.