Funding granted for NanoMill® TEM specimen preparation system

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20. July 2017

The application for funding of the NanoMill® TEM specimen preparation system has been granted recently by DFG.

Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

More details about the standard specification, capability and application exampled from recent literature can be found on the manufacturer’s website.

We believe the introduction of the modern preparation facilities (including the FIB-SEM, microPREP and NanoMill) will further enhance the capability and expertise in high-quality sample preparation work flow for advanced TEM imaging and analysis at IMN/CENEM.

Further news about the delivery, installation, test runs and update to our facility category will follow soon.